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Sequential test generation based on circuit pseudo-transformation

Sequential test generation based on circuit pseudo-transformation

Satoshi Ohtake, Tomoo Inoue and Hideo Fujiwara

生駒 : 奈良先端科学技術大学院大学, 1997.7

In-house publ.

Volume No.

Total: 1
No. Printing year Location Call Number Material ID Circulation class Status Waiting

1

  • TR

R000653

Details

Publication year

1997

Series title

Information Science Technical Report ; TR97014

Country of publication

Japan

Title language

English (eng)

Language of texts

English (eng)

Author information

大竹, 哲史 (オオタケ, サトシ)

井上, 智生 (イノウエ, トモオ)

藤原, 秀雄 (1946-) (フジワラ, ヒデオ) [ Huziwara, Hideo ] [ Fujiwara, Hideo ]

ISSN

09199527