• Top
  • Details (Local collection)
Design for testability based on single-port-change delay testing for data paths

Design for testability based on single-port-change delay testing for data paths

Yuki Yoshikawa, Satoshi Ohtake, Michiko Inoue, Hideo Fujiwara

生駒 : 奈良先端科学技術大学院大学, 2005.8

In-house publ.

Volume No.

Total: 1
No. Printing year Location Call Number Material ID Circulation class Status Waiting

1

  • TR

R003641

Details

Publication year

2005

Form

6 p.

Series title

Information Science Technical Report ; TR2005005

Country of publication

Japan

Title language

English (eng)

Language of texts

English (eng)

Author information

吉川, 祐樹 (ヨシカワ, ユウキ)

大竹, 哲史 (オオタケ, サトシ)

井上, 美智子 (イノウエ, ミチコ)

藤原, 秀雄 (1946-) (フジワラ, ヒデオ) [ Huziwara, Hideo ] [ Fujiwara, Hideo ]

ISSN

09199527