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Classification of sequential circuits based on combinational test generation complexity

Classification of sequential circuits based on combinational test generation complexity

Chia Yee Ooi and Hideo Fujiwara

生駒 : 奈良先端科学技術大学院大学, 2004.1

In-house publ.

Volume No.

Total: 1
No. Printing year Location Call Number Material ID Circulation class Status Waiting

1

  • TR

R002733

Details

Publication year

2004

Form

18 p.

Series title

Information Science Technical Report ; TR2004001

Country of publication

Japan

Title language

English (eng)

Language of texts

English (eng)

Author information

Ooi, Chia Yee

藤原, 秀雄(1946-) (フジワラ, ヒデオ) [ Huziwara, Hideo ] [ Fujiwara, Hideo ]

ISSN

09199527