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Universal Test Complexity of Field-Programmable Gate Arrays

Universal Test Complexity of Field-Programmable Gate Arrays

Tomoo Inoue, Hideo Fujiwara, Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto

生駒 : 奈良先端科学技術大学院大学, 1999.4

In-house publ.

Volume No.

Total: 1
No. Printing year Location Call Number Material ID Circulation class Status Waiting

1

  • TR

R000817

Details

Publication year

1999

Series title

Information Science Technical Report ; TR99006

Country of publication

Japan

Title language

English (eng)

Language of texts

English (eng)

Author information

井上, 智生 (イノウエ, トモオ)

藤原, 秀雄 (1946-) (フジワラ, ヒデオ) [ Huziwara, Hideo ] [ Fujiwara, Hideo ]

道西, 博行 (ミチニシ, ヒロユキ)

横平, 徳美 (ヨコヒラ, トクミ)

岡本, 卓爾 (オカモト, タクジ)

ISSN

09199527