sponsored by IEEE Computer Society Technical Committee on Test Technology, Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuit Society ; edited by D. Lepejian, ... [et al.]
Los Alamitos, Cailf : IEEE Computer Society Press, c1998
図書| No. | 刷年 | 所在 | 請求記号 | 資料ID | 貸出区分 | 状況 | 予約人数 |
|---|---|---|---|---|---|---|---|
|
1 |
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9103180 |
研究室 |
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1998
ix, 131 p. : ill. ; 28 cm
98TB100236
Memory Technology, Design and Testing
MTDT'98
"IEEE Order Plan Catalog Number 98TB100236"--T.p. verso
"IEEE Computer Society Order Number PR08494"--T.p. verso
Includes bibliographical references and index
英語 (eng)
英語 (eng)
IEEE International Workshop on Memory Technology, Design, and Testing
IEEE Computer Society. Test Technology Technical Committee [ IEEE Computer Society. Technical Committee on Test Technology ]
LCC:TK7895.M4
DC21:621.39/732
0818684941
BA43731238
LCCN : 97202128
