sponsored by IEEE Computer Society Technical Committee on Test Technology, Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuit Society ; edited by D. Lepejian, ... [et al.]
Los Alamitos, Cailf : IEEE Computer Society Press, c1998
Book| No. | Printing year | Location | Call Number | Material ID | Circulation class | Status | Waiting |
|---|---|---|---|---|---|---|---|
|
1 |
|
|
9103180 |
Lab |
|
|
1998
ix, 131 p. : ill. ; 28 cm
98TB100236
Memory Technology, Design and Testing
MTDT'98
"IEEE Order Plan Catalog Number 98TB100236"--T.p. verso
"IEEE Computer Society Order Number PR08494"--T.p. verso
Includes bibliographical references and index
United States
English (eng)
English (eng)
IEEE International Workshop on Memory Technology, Design, and Testing
IEEE Computer Society. Test Technology Technical Committee [ IEEE Computer Society. Technical Committee on Test Technology ]
LCC:TK7895.M4
DC21:621.39/732
0818684941
BA43731238
LCCN : 97202128
