Contents Intro.

The talk provides for an introduction to the problem of digital systems testing, which is followed by an overview of test methods. Tallinn University of Technology (TUT) has more than three decades of experience in implementing Decision Diagram (DD) models in test. Some of this experience is shared in the second part of the lecture by introducing alternative DD representations. In particular two DD models: structurally synthesized binary decision diagrams and high-level DDs are explained. It is shown how these models can be applied to solving different test tasks.

Details

Publication year

2008

Form

電子化映像資料(1時間9分53秒)

Series title

情報科学研究科・ゼミナール講演 ; 平成20年度

Note

講演者所属: Tallinn University of Technology

講演日: 平成20年7月28日

講演場所: 情報科学研究科大講義室

Country of publication

Japan

Title language

English (eng)

Language of texts

English (eng)

Author information

Raik, Jaan