![Introduction to I[ ]D[ ]D[ ]Q[ ] testing](/opac/images/cyan/icon_book.png){kind=icon}
by Sreejit Chakravarty and Paul J. Thadikaran
Boston : Kluwer Academic Publishers, c1997
Book| No. | Printing year | Location | Call Number | Material ID | Circulation class | Status | Waiting |
|---|---|---|---|---|---|---|---|
|
1 |
|
|
9111904 |
Regular |
|
|
|
|
2 |
|
|
9103027 |
Lab |
|
1997
xvii, 322 p. : ill. ; 25 cm
Introduction to IDDQ testing
On t.p. "D̳D̳Q̳" is subscript
Includes bibliographical references (p. 287-315) and index
United States
English (eng)
English (eng)
LCC:TK7871.99.M44
DC21:621.39/5/0287
Digital integrated circuits -- Testing
Integrated circuits -- Very large scale integration -- Testing
0792399455
BA3656409X
LCCN : 97016861
