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An Non-scan DFT Method at RTL Based on Fixed-control Testability to Achieve 100% Fault Efficiency

An Non-scan DFT Method at RTL Based on Fixed-control Testability to Achieve 100% Fault Efficiency

Satoshi Ohtake, Shintaro Nagai, Hiroki Wada, Hideo Fujiwara

生駒 : 奈良先端科学技術大学院大学, 2000.11

In-house publ.

Volume No.

Total: 1
No. Printing year Location Call Number Material ID Circulation class Status Waiting

1

  • TR

R001440

Details

Publication year

2000

Series title

Information Science Technical Report ; TR2000009

Country of publication

Japan

Title language

English (eng)

Language of texts

English (eng)

Author information

大竹, 哲史 (オオタケ, サトシ)

永井, 慎太郎 (ナガイ, シンタロウ)

和田, 弘樹 (ワダ, ヒロキ)

藤原, 秀雄 (1946-) (フジワラ, ヒデオ) [ Huziwara, Hideo ] [ Fujiwara, Hideo ]

ISSN

09199527