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Test Generation for Acyclic Sequential Circuits with Hold Registers

Test Generation for Acyclic Sequential Circuits with Hold Registers

Tomoo Inoue, Chiiho Sano, Takahiro Mihara, Hideo Fujiwara

生駒 : 奈良先端科学技術大学院大学, 1999.4

In-house publ.

Volume No.

Total: 1
No. Printing year Location Call Number Material ID Circulation class Status Waiting

1

  • TR

R000818

Details

Publication year

1999

Series title

Information Science Technical Report ; TR99007

Country of publication

Japan

Title language

English (eng)

Language of texts

English (eng)

Author information

井上, 智生 (イノウエ, トモオ)

佐野, ちいほ (サノ, チイホ)

三原, 隆宏 (ミハラ, タカヒロ)

藤原, 秀雄 (1946-) (フジワラ, ヒデオ) [ Huziwara, Hideo ] [ Fujiwara, Hideo ]

ISSN

09199527