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New DFT Techniques of Non-Scan Sequential Circuits with Complete Fault Efficiency

New DFT Techniques of Non-Scan Sequential Circuits with Complete Fault Efficiency

Debesh Kumar Das, Satoshi Ohtake and Hideo Fujiwara

生駒 : 奈良先端科学技術大学院大学, 1998.11

In-house publ.

Volume No.

Total: 1
No. Printing year Location Call Number Material ID Circulation class Status Waiting

1

  • TR

R000807

Details

Publication year

1998

Series title

Information Science Technical Report ; TR98013

Country of publication

Japan

Title language

English (eng)

Language of texts

English (eng)

Author information

Das, Debesh Kumar

大竹, 哲史 (オオタケ, サトシ)

藤原, 秀雄 (1946-) (フジワラ, ヒデオ) [ Huziwara, Hideo ] [ Fujiwara, Hideo ]

ISSN

09199527