内容紹介

The talk provides for an introduction to the problem of digital systems testing, which is followed by an overview of test methods. Tallinn University of Technology (TUT) has more than three decades of experience in implementing Decision Diagram (DD) models in test. Some of this experience is shared in the second part of the lecture by introducing alternative DD representations. In particular two DD models: structurally synthesized binary decision diagrams and high-level DDs are explained. It is shown how these models can be applied to solving different test tasks.

詳細情報

刊年

2008

形態

電子化映像資料(1時間9分53秒)

シリーズ名

情報科学研究科・ゼミナール講演 ; 平成20年度

注記

講演者所属: Tallinn University of Technology

講演日: 平成20年7月28日

講演場所: 情報科学研究科大講義室

標題言語

英語 (eng)

本文言語

英語 (eng)

著者情報

Raik, Jaan