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Area and time co-optimization for system-on-a-chip based on consecutive testability

Area and time co-optimization for system-on-a-chip based on consecutive testability

Tomokazu Yoneda, Tetsuo Uchiyama and Hideo Fujiwara

生駒 : 奈良先端科学技術大学院大学, 2003.2

In-house publ.

Volume No.

Total: 1
No. Printing year Location Call Number Material ID Circulation class Status Waiting

1

  • TR

R004338

Details

Publication year

2003

Form

8 p.

Series title

Information Science Technical Report ; TR2003002

Country of publication

Japan

Title language

English (eng)

Language of texts

English (eng)

Author information

米田, 友和 (ヨネダ, トモカズ)

内山, 哲夫 (ウチヤマ, テツオ)

藤原, 秀雄(1946-) (フジワラ, ヒデオ) [ Huziwara, Hideo ] [ Fujiwara, Hideo ]

ISSN

09199527