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An Non-scan DFT Method at RTL Based on Fixed-control Testability to Achieve 100% Fault Efficiency

An Non-scan DFT Method at RTL Based on Fixed-control Testability to Achieve 100% Fault Efficiency

Satoshi Ohtake, Shintaro Nagai, Hiroki Wada, Hideo Fujiwara

生駒 : 奈良先端科学技術大学院大学, 2000.11

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Total: 1
No. Printing year Location Call Number Material ID Circulation class Status Waiting

1

  • TR

R001440

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Publication year

2000

Series title

Information Science Technical Report ; TR2000009

Country of publication

Japan

Title language

English (eng)

Language of texts

English (eng)

Author information

大竹, 哲史 (オオタケ, サトシ)

永井, 慎太郎 (ナガイ, シンタロウ)

和田, 弘樹 (ワダ, ヒロキ)

藤原, 秀雄(1946-) (フジワラ, ヒデオ) [ Huziwara, Hideo ] [ Fujiwara, Hideo ]

ISSN

09199527

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