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Reducibility of sequential test generation to combinational test generation for several delay fault models

Reducibility of sequential test generation to combinational test generation for several delay fault models

Tsuyoshi Iwagaki, Satoshi Ohtake and Hideo Fujiwara

生駒 : 奈良先端科学技術大学院大学, 2003.9

In-house publ.

Volume No.

Total: 1
No. Printing year Location Call Number Material ID Circulation class Status Waiting

1

  • TR

R002725

Details

Publication year

2003

Form

6 p.

Series title

Information Science Technical Report ; TR2003009

Country of publication

Japan

Title language

English (eng)

Language of texts

English (eng)

Author information

岩垣, 剛 (イワガキ, ツヨシ)

大竹, 哲史 (オオタケ, サトシ)

藤原, 秀雄(1946-) (フジワラ, ヒデオ) [ Huziwara, Hideo ] [ Fujiwara, Hideo ]

ISSN

09199527