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An approach to reduce over-testing of path delay faults in data paths using RT-level information

An approach to reduce over-testing of path delay faults in data paths using RT-level information

Yuki Yoshikawa, Satoshi Ohtake and Hideo Fujiwara

生駒 : 奈良先端科学技術大学院大学, 2006.2

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Total: 1
No. Printing year Location Call Number Material ID Circulation class Status Waiting

1

  • TR

R003667

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Publication year

2006

Form

5 p.

Series title

Information Science Technical Report ; TR2006001

Country of publication

Japan

Title language

English (eng)

Language of texts

English (eng)

Author information

吉川, 祐樹 (ヨシカワ, ユウキ)

大竹, 哲史 (オオタケ, サトシ)

藤原, 秀雄(1946-) (フジワラ, ヒデオ) [ Huziwara, Hideo ] [ Fujiwara, Hideo ]

ISSN

09199527

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