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Highly Reliable Memory Architectures Using Combination of In-Field Self-Repair, ECC and Aging Test

Highly Reliable Memory Architectures Using Combination of In-Field Self-Repair, ECC and Aging Test

Gian Paolo Topico Mayuga

生駒 : 奈良先端科学技術大学院大学, 2016.9

Thesis / Diss.

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Volume No.

Total: 2
No. Printing year Location Call Number Material ID Circulation class Status Waiting

1

R013151

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要旨
要旨
No. Printing year Location Call Number Material ID Circulation class Status Waiting

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  • Abstract

R013177

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Publication year

2016

Alternative title

フィールドでの自己修復、誤り訂正、劣化検知を組み合わせた高信頼メモリアーキテクチャ

Series title

奈良先端科学技術大学院大学情報科学研究科博士論文 ; 2016年9月

Note

学位記番号: 博第1372号

報告番号: 甲第1372号

学位授与年月日: 2016/09/26

学位の種類: 博士(工学)

学生番号: 1361204

Country of publication

Japan

Title language

English (eng)

Language of texts

English (eng)

Author information

Gian Paolo Topico Mayuga

Subject

memory repair

memory reliability

in-field test and repair

ECC

in-field repair strategy

aging-aware

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