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Acceleration of transition test generation for acyclic sewuential circuits utilizing constrained combinational stuck-at test generation

Acceleration of transition test generation for acyclic sewuential circuits utilizing constrained combinational stuck-at test generation

Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara

生駒 : 奈良先端科学技術大学院大学, 2004.12

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Total: 1
No. Printing year Location Call Number Material ID Circulation class Status Waiting

1

  • TR

R003223

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Publication year

2004

Form

9 p.

Series title

Information Science Technical Report ; TR2004009

Country of publication

Japan

Title language

English (eng)

Language of texts

English (eng)

Author information

岩垣, 剛 (イワガキ, ツヨシ)

大竹, 哲史 (オオタケ, サトシ)

藤原, 秀雄(1946-) (フジワラ, ヒデオ) [ Huziwara, Hideo ] [ Fujiwara, Hideo ]

ISSN

09199527

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