![Test generation complexity for stuck-at and path delay faults based on tau[k] - notation](/opac/images/cyan/icon_our_paper.png){kind=icon}
Chia Yee Ooi, Thomas Clouqueur and Hideo Fujiwara
生駒 : 奈良先端科学技術大学院大学, 2005.5
In-house publ.
| No. | Printing year | Location | Call Number | Material ID | Circulation class | Status | Waiting |
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1 |
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R003639 |
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2005
43 p.
Information Science Technical Report ; TR2005003
[k] is superscript
Japan
English (eng)
English (eng)
藤原, 秀雄(1946-) (フジワラ, ヒデオ) [ Huziwara, Hideo ] [ Fujiwara, Hideo ]
09199527
