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Browsing 国際会議発表論文 / Proceedings by Subject "Vectors"

Browsing 国際会議発表論文 / Proceedings by Subject "Vectors"

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  • Limsettho, Nachai; Hata, Hideaki; Monden, Akito; Matsumoto, Kenichi (IEEE, 2014)
    Background: Information in bug reports is implicit and therefore difficult to comprehend. To extract its meaning, some processes are required. Categorizing bug reports is a technique that can help in this regard. It can ...
  • Fujiwara, Shin; Hata, Hideaki; Monden, Akito; Matsumoto, Kenichi (IEEE, 2015)
    Large software projects such as Mozilla Firefox and Eclipse own more than ten thousand bug reports that have been reported but left unresolved. To utilize such a great amount of unresolved bug reports and accelerate bug ...
  • Pingclasai, Natthakul; Hata, Hideaki; Matsumoto, Ken-ichi (IEEE, 2013)
    Bug reports are widely used in several research areas such as bug prediction, bug triaging, and etc. The performance of these studies relies on the information from bug reports. Previous study showed that a significant ...
  • Kawai, Norihiko; Sato, Tomokazu; Yokoya, Naokazu (IEEE, 2013)
    This paper proposes a new diminished reality method for 3D scenes considering background structures. Most conventional methods using image inpainting assumes that the background around a target object is almost planar. In ...
  • Miyase, Kohei; Uchinodan, Yuta; Enokimoto, Kazunari; Yamato, Yuta; Wen, Xiaoqing; Kajihara, Seiji; Wu, Fangmei; Luiji, Dilillo; Alberto, Bosio; Patrick, Girard; Arnaud, Virazel (IEEE, 2011)
    It has become necessary to reduce power during LSI testing. Particularly, during at-speed testing, excessive power consumed during the Launch-To-Capture (LTC) cycle causes serious issues that may lead to the overkill of ...
  • Nakashima, Yuta; Yokoya, Naokazu (IEEE, 2013)
    Detecting important regions in videos has been extensively studied for past decades for their wide variety of applications including video summarization and retargeting. Visual attention models draw much attention for this ...
  • Miyase, Kohei; Aso, Masao; Ootsuka, Ryou; Wen, Xiaoqing; Furukawa, Hiroshi; Yamato, Yuta; Enokimoto, Kazunari; Kajihara, Seiji (IEEE, 2012)
    Excessive capture power in at-speed scan testing may cause yield loss due to timing failures. Although reducing the number of clock domains that capture test responses simultaneously is a practical and scalable solution ...
  • Kawai, Norihiko; Zakhor, Avideh; Sato, Tomokazu; Yokoya, Naokazu (IEEE, 2011)
    In this paper, we propose a novel surface completion method to generate plausible shapes and textures for missing regions of 3D models. The missing regions are filled in by minimizing two energy functions for shape and ...

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