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Browsing 国際会議発表論文 / Proceedings by Subject "N-Gram IDF"

Browsing 国際会議発表論文 / Proceedings by Subject "N-Gram IDF"

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  • Supatsara, Wattanakriengkrai; Napat, Srisermphoak; Sahawat, Sintoplertchaikul; Morakot l, Choetkiertiku; Chaiyong, Ragkhitwetsagul; Thanwadee, Sunetnanta; Hata, Hideaki; Matsumoto, Kenichi (IEEE, 2019-12-05)
    Technical Debt (TD) introduces a quality problem and increases maintenance cost since it may require improvements in the future. Several studies show that it is possible to automatically detect TD from source code comments ...

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