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組込み自己テスト回路を用いた物理複製困難関数回路のチャレンジレスポンス対の収集効率化および機械学習攻撃耐性の向上

三野, 智貴

URI: http://hdl.handle.net/10061/14367

Date: 2020-03-31

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Version: author

Language: ja

Fulltext: http://library.naist.jp/mylimedio/dllimedio/show.cgi?bookid=100245292

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情報科学研究科 / Graduate School of Information Science [3410]

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