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Browsing テクニカルレポート / Technical Report by Title

Now showing items 1-20 of 172

A-tree : an index structure for high-dimensional spaces using ralative approximation

Sakurai, Yasushi; Yoshikawa, Masatoshi; Uemura, Shunsuke; Kojima, Haruhiko (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2000-12)

We propose a novel index structure, the A-tree (Approximation tree), for the similarity search of high-dimensional data. The basic idea of the A-tree is the introduction of Virtual Bounding Rectangles (VBRs) which contain ...
Acceleration of transition test generation for acyclic sewuential circuits utilizing constrained combinational stuck-at test generation

Iwagaki, Tsuyoshi; Ohtake, Satoshi; Fujiwara, Hideo (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2004-12)

This paper presents a transition test generation method for acyclic sequential circuits. In this method, to generate test sequences for transition faults in a given acyclic sequential circuit, constrained combinational ...
Anonymous Bidding Protocols Using an Anonymous Undeniable Signature

Nakanishi, Toru; Fujiwara, Toru; Watanabe, Hajime (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 1999-01)

Anonymous bidding protocols using an anonymous undeniable signature scheme without assuming the existence of any reliable center are proposed. The anonymity of a bidding protocol means that the participation of anyone to ...
Application-Level Jitter Reduction Scheme for Multimedia Communication over ATM-ABR Service

Adachi, Naotoshi; Kasahara, Shoji; Takahashi, Yutaka (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2000-10)

The ATM-ABR service category provides minimum cell rate (MCR) guarantees and robust connections even with insufficient network resources. Recently proposed rate-management algorithms for supporting multimedia applications ...
An approach to reduce over-testing of path delay faults in data paths using RT-level information

Yoshikawa, Yuki; Ohtake, Satoshi; Fujiwara, Hideo (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2006-02)

In this paper, we present an approach to reduce overtesting of path delay faults (PDFs). To reduce test generation complexity, design-for-testability (DFT) techniques are used in order to make a large number of untestable ...
An Approach to RTL False Path Mapping Using Uniqueness of Paths

Iwata, Hiroshi; Ohtake, Satoshi; Fujiwara, Hideo (奈良先端科学技術大学院大学Nara Institute of Science and Technology, 2009-09)
Area and time co-optimization for system-on-a-chip based on consecutive testability

Yoneda, Tomokazu; Uchiyama, Tetsuo; Fujiwara, Hideo (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2003-02)

Test access mechanism and test scheduling are integral parts of SoC test. This paper presents an area overhead and test time co-optimization method for SoCs based on consecutive testability. The proposed method creates TAM ...
Automatic Approach to Prepare Information for Constructing an Assurance Case

Chindamaikul, Khana; Takai, Toshinori; Port, Daniel; Iida, Hajimu (奈良先端科学技術大学院大学Nara Institute of Science and Technology, 2014-12)
Automatic Generation of History-Based Access Control from Information Flow Specification

Takata, Yoshiaki; Seki, Hiroyuki (奈良先端科学技術大学院大学Nara Institute of Science and Technology, 2010-04)
Automatic generation of java query API capable of simulating active database

Majima, Toshiaki (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2003-08)

Various programming languages provide application programmer’s interfaces (API) for accessing databases. Traditional APIs, however, require the developers to explicitly include Structured Query Language (SQL) statements ...
Balancing plasticity and stability of on-line learning based on hierarchical Bayesian adaptation of forgetting factors

Hirayama, Junichiro; Yoshimoto, Junichiro; Ishii, Shin (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2005-11)

An important character of on-line learning is its potential to adapt to changing environments by properly adjusting meta-parameters that control the balance between plasticity and stability of the learning model. In our ...
Blocking Behavior of Queueing System with Finite Buffer and Pseudo Self-similar Input

Kasahara, Shoji (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2000-08)

It is well known that the fitting methods based on the second-order statistics of counts for the arrival process are not sufficient for predicting the performance of the queueing system with self-similar input. However ...
Burst-cluster transmission : service differentiation mechanism for immediate reservation in oprical burst switching networks

Tachibana, Takuji; Kasahara, Shoji (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2004-09)

In this paper, we propose a service differentiated burst transmission called burst-cluster transmission to provide the service differentiation in terms of burst loss for optical burst switching networks. The proposed method ...
Bypassed Alignment Graph for Learning Coordination inJapanese Sentences: Supplementary Material

Okuma, Hideharu; Hara, Kazuo; Shimbo, Masashi; Matsumoto, Yuji (奈良先端科学技術大学院大学Nara Institute of Science and Technology, 2009-07)
Byzantine gathering in networks with authenticated whiteboards

Tsuchida, Masashi; Ooshita, Fukuhito; Inoue, Michiko (奈良先端科学技術大学院大学Nara Institute of Science and Technology, 2016-12)
Chomsky-Schutzenberger-Type Characterization of Multiple Context-Free Languages

Yoshinaka, Ryo; Kaji, Yuichi; Seki, Hiroyuki (奈良先端科学技術大学院大学Nara Institute of Science and Technology, 2010-04)
CLAS : an approach for full use of application software

Matsumoto, Ken-ichi; Morisaki, Shuuji; Monden, Akito; Torii, Koji (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2001-03)

Many of the latest application software provide users with a large number of functions; however, the full set of functions is too large for diverse users. Most of users usually use only 10% of the full set of functions ...
Classification of sequential circuits based on acyclic test generation complexity

Ooi, Chia Yee; Fujiwara, Hideo (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2006-07)

This paper introduces a new class of sequential circuits called acyclically testable sequential circuits which is wider than the class of acyclic sequential circuits but whose test generation complexity is equivalent to ...
Classification of sequential circuits based on combinational test generation complexity

Ooi, Chia Yee; Fujiwara, Hideo (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2004-01)

Several classes of sequential circuits with combinational test generation complexity have been introduced. However, no general notation is used to define the time complexity of test generation. In this paper, we introduce ...
Comparison of the Expressive Power of Language-basedAccess Control Models

Takata, Yoshiaki; Seki, Hiroyuki (奈良先端科学技術大学院大学Nara Institute of Science and Technology, 2008-07)

This paper compares the expressive power of five languagebased access control models. We show that the expressive powers are incomparable between any pair of history-based access control, regular stack inspection and shallow ...

Now showing items 1-20 of 172

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