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Browsing 学術雑誌論文 / Journal Article by Author "Fujiwara, Hideo"

Browsing 学術雑誌論文 / Journal Article by Author "Fujiwara, Hideo"

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  • Inoue, Michiko; Taketani, Akira; Yoneda, Tomokazu; Fujiwara, Hideo (一般社団法人電子情報通信学会, 2012-12-01)
    Nano-scale VLSI design is facing the problems of increased test data volume. Small delay defects are becoming possible sources of test escapes, and high delay test quality and therefore a greater volume of test data are ...

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