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Browsing テクニカルレポート / Technical Report by Subject "consecutive testability"

Browsing テクニカルレポート / Technical Report by Subject "consecutive testability"

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  • Yoneda, Tomokazu; Uchiyama, Tetsuo; Fujiwara, Hideo (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2003-02)
    Test access mechanism and test scheduling are integral parts of SoC test. This paper presents an area overhead and test time co-optimization method for SoCs based on consecutive testability. The proposed method creates TAM ...

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