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Browsing テクニカルレポート / Technical Report by Author "Clouqueur, Thomas"

Browsing テクニカルレポート / Technical Report by Author "Clouqueur, Thomas"

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  • Ooi, Chia Yee; Clouqueur, Thomas; Fujiwara, Hideo (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2005-05)
    This papcr introduces Tk-notation to be used to analyze the test generation complexity of a class of circuits with a type offaults. In this paper, we discuss classes of sequential circuits and combinational circuits with ...

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