DSpace Repository

Browsing テクニカルレポート / Technical Report by Title

Browsing テクニカルレポート / Technical Report by Title

Sort by: Order: Results:

  • Yokoya, Naokazu (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 1994-08)
    This paper describes a method of establishing dense matching of two views with large displacements. The problem addressed is formulated as the minimization of an energy functional that combines a similarity term and a ...
  • Tamada, Haruaki; Okamoto, Keiji; Nakamura, Masahide; Monden, Akito; Matsumoto, Ken-ichi (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2007-05)
    This paper presents a technique of dynamic software birthmarks to support efficient detection of software theft. A dynamic birthmark f(p,I) is a set of unique and native characteristics of a program p, obtained by executing ...
  • Yoneda, Tomokazu; Fujiwara, Hideo (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2002-07)
    This paper presents a design-for-consecutive-transparency method that makes a core (RTL circuit) consecutively transparent using integer linear program-ming. Consecutive transparency of a core guarantees consecutive ...
  • Yoshikawa, Yuki; Ohtake, Satoshi; Inoue, Michiko; Fujiwara, Hideo (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2005-08)
    This paper introduces a new concept of hierarchical testability called Single-Port-Change (SPC) two-pattern testability. We propose a non-scan design-for-testability (DFT) method which makes each path that needs to be ...
  • Iwagaki, Tsuyoshi; Ohtake, Satoshi; Fujiwara, Hideo (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2003-09)
    This paper proposes a non-scan testing scheme to enhance delay fault testability of controllers. In this scheme, the original behavior of a given controller is used in test application, and the faults which cannot be ...
  • Tamada, Haruaki; Nakamura, Masahide; Monden, Akito; Matsumoto, Ken-ichi (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2003-11)
    To support the efficient detection of theft of Java class files, this paper presents a new method to derive birthmarks from given Java class files. The proposed method extracts from a class file a set of unique characteristics, ...
  • Kenji Hashimoto; Ryuta Sawada; Yasunori Ishihara; Hiroyuki Seki; Toru Fujiwara (奈良先端科学技術大学院大学Nara Institute of Science and Technology, 2012-11)
  • Yoneda, Tomokazu; Fujiwara, Hideo (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2001-05)
    This paper proposes a new methodology for testing a core-based systems-on-a-chip (SoC) based on a new concept of testability called consecutive testability. In the proposed method, test sequence of a core embedded deep in ...
  • Nitta, Naoya; Ikada, Satoshi; Takata, Yoshiaki; Seki, Hiroyuki (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2001-03)
    Java development kit 1.2 provides a runtime access control mechanism which inspects a control stack to examine whether the program has appropriate access permissions. For such a programming language, it is desirable to ...
  • Itaya, Natsuki; Kasahara, Shoji (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2003-04)
    With the extensive spread of the Internet and mobile terminals, the Internet access from a mobile terminal becomes more important than ever before. In the Internet, Transmission Control Protocol (TCP) is used as a standard ...
  • Inoue, Michiko; Nakazato, Masato; Yokoyama, Shinya; Kambe, Kazuko; Fujiwara, Hideo (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2006-08)
    This paper presents a method of test program generation for software-based self-test of pipelined processors. We propose a model of pipelined processors and testability measures for registers. We generate a test program ...
  • Suzuki, Tsuyoshi; Inoue, Michiko; Fujiwara, Hideo (奈良先端科学技術大学院大学Nara Institute of Science and Technology, 2009-01)
    We propose an efficient mutual exclusion algorithm with respect to remote memory reference(RMR) complexity that measures remote accesses to shared memory. The worst-case RMR complexity for one access to a critical section ...
  • Chia Yee Ooi; Hideo Fujiwara (奈良先端科学技術大学院大学Nara Institute of Science and Technology, 2010-08)
  • Takada, Shingo; Scott, Louise; Brooks, Andy (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 1999-02)
    This paper reports on a second pilot experiment for the CADPRO project taking into account a number of the recommendations arising from the first pilot. Three subjects produced data flow diagrams and class diagrams in a ...
  • Brooks, Andy; Scott, Louise; Takada, Shingo (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 1998-10)
    This paper reports an evaluation of a number of metrics proposed to measure user productivity and product quality in a usability laboratory setting. The examined metrics were found to be unsuitable indicators of productivity ...
  • Imada, Akira; Araki, Keijiro (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 1997-08)
    We apply evolutionary computations to Hopfield's neural network model of associative memory. We reported elsewhere that a fully connected neural network with random synaptic weights evolves to create fixed point attractors ...
  • Kume, Izuru; Nitta, Naoya; Takemura, Yasuhiro (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2007-05)
    Project-based training is effective for practical software engineering education. Our goal is to establish a practical training method in software engineering education that is easier to be introduced by higher education ...
  • Morisaki, Shuji; Monden, Akito; Tamada, Haruaki; Matsumura, Tomoko; Matsumoto, Ken-ichi (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2006-11)
    This paper proposes a method to mine rules from software engineering data repositories that contain a number of quantitative attributes such as staff months and SLOC. The proposed method extends conventional association ...
  • Nitta, Naoya; Seki, Hiroyuki (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2003-06)
    In this paper, we present a class of infinite transition systems which is an extension of pushdown systems (PDS), and show that LTL (linear temporal logic) model checking for the class is decidable. Sincthe class is defined ...
  • Gizdarski, Emil; Fujiwara, Hideo (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2001-03)
    In this paper, we present a technique for reducing the test length of the counter-based pseudo-exhaustive built-in self-testing (BIST) using the width compression method and the divide-and-conquer strategy. More formally, ...

Search DSpace


Advanced Search

Browse

My Account