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Browsing テクニカルレポート / Technical Report by Title

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  • Hirayama, Junichiro; Yoshimoto, Junichiro; Ishii, Shin (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2005-11)
    An important character of on-line learning is its potential to adapt to changing environments by properly adjusting meta-parameters that control the balance between plasticity and stability of the learning model. In our ...
  • Kasahara, Shoji (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2000-08)
    It is well known that the fitting methods based on the second-order statistics of counts for the arrival process are not sufficient for predicting the performance of the queueing system with self-similar input. However ...
  • Tachibana, Takuji; Kasahara, Shoji (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2004-09)
    In this paper, we propose a service differentiated burst transmission called burst-cluster transmission to provide the service differentiation in terms of burst loss for optical burst switching networks. The proposed method ...
  • Okuma, Hideharu; Hara, Kazuo; Shimbo, Masashi; Matsumoto, Yuji (奈良先端科学技術大学院大学Nara Institute of Science and Technology, 2009-07)
  • Masashi Tsuchida; Fukuhito Ooshita; Michiko Inoue (奈良先端科学技術大学院大学Nara Institute of Science and Technology, 2016-12)
  • Yoshinaka, Ryo; Kaji, Yuichi; Seki, Hiroyuki (奈良先端科学技術大学院大学Nara Institute of Science and Technology, 2010-04)
  • Matsumoto, Ken-ichi; Morisaki, Shuuji; Monden, Akito; Torii, Koji (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2001-03)
    Many of the latest application software provide users with a large number of functions; however, the full set of functions is too large for diverse users. Most of users usually use only 10% of the full set of functions ...
  • Ooi, Chia Yee; Fujiwara, Hideo (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2006-07)
    This paper introduces a new class of sequential circuits called acyclically testable sequential circuits which is wider than the class of acyclic sequential circuits but whose test generation complexity is equivalent to ...
  • Ooi, Chia Yee; Fujiwara, Hideo (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2004-01)
    Several classes of sequential circuits with combinational test generation complexity have been introduced. However, no general notation is used to define the time complexity of test generation. In this paper, we introduce ...
  • Takata, Yoshiaki; Seki, Hiroyuki (奈良先端科学技術大学院大学Nara Institute of Science and Technology, 2008-07)
    This paper compares the expressive power of five languagebased access control models. We show that the expressive powers are incomparable between any pair of history-based access control, regular stack inspection and shallow ...
  • Kasami, Tadao; Koumoto, Takuya (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 1998-07)
    Sufficient conditions on the optimality of a candidate codeword, which is generated in an iterative soft-decision decoding algorithm for block codes, have been derived based on (1) partial knowledge of the distance profile ...
  • Kwon, Yeon-Dae; Ishihara, Yasunori; Shimizu, Shougo; Ito, Minoru (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2000-02)
    Data mining is to analyze all the data in a huge database and to obtain useful information for database users. One of the well-studied problems in data mining is the search for meaningful association rules in a market ...
  • Nishitani, Hirokazu (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 1994-07)
    Plant operation involves a high degree of interdependence between process equipment control systems and human operators. Nowadays, flexible production in the process industry is greatiy owing to the operator's control ...
  • Iida, Ryu; Miyamoto, Edoson T. (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2002-11)
  • Yokoya, Naokazu (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 1994-08)
    This paper describes a method of establishing dense matching of two views with large displacements. The problem addressed is formulated as the minimization of an energy functional that combines a similarity term and a ...
  • Tamada, Haruaki; Okamoto, Keiji; Nakamura, Masahide; Monden, Akito; Matsumoto, Ken-ichi (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2007-05)
    This paper presents a technique of dynamic software birthmarks to support efficient detection of software theft. A dynamic birthmark f(p,I) is a set of unique and native characteristics of a program p, obtained by executing ...
  • Yoneda, Tomokazu; Fujiwara, Hideo (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2002-07)
    This paper presents a design-for-consecutive-transparency method that makes a core (RTL circuit) consecutively transparent using integer linear program-ming. Consecutive transparency of a core guarantees consecutive ...
  • Yoshikawa, Yuki; Ohtake, Satoshi; Inoue, Michiko; Fujiwara, Hideo (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2005-08)
    This paper introduces a new concept of hierarchical testability called Single-Port-Change (SPC) two-pattern testability. We propose a non-scan design-for-testability (DFT) method which makes each path that needs to be ...
  • Iwagaki, Tsuyoshi; Ohtake, Satoshi; Fujiwara, Hideo (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2003-09)
    This paper proposes a non-scan testing scheme to enhance delay fault testability of controllers. In this scheme, the original behavior of a given controller is used in test application, and the faults which cannot be ...
  • Tamada, Haruaki; Nakamura, Masahide; Monden, Akito; Matsumoto, Ken-ichi (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2003-11)
    To support the efficient detection of theft of Java class files, this paper presents a new method to derive birthmarks from given Java class files. The proposed method extracts from a class file a set of unique characteristics, ...

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