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学術リポジトリ naistar / NAIST Academic Repository naistar

学術リポジトリ naistar / NAIST Academic Repository naistar

最新登録資料

  • Komatsu, Nobuhisa; Sasabe, Masahiro; Kasahara, Shoji (Springer, 2016-08-11)
    We have proposed an automatic evacuation guiding scheme based on cooperation between evacuees and their mobile nodes. In the previous work, we assume that information about blocked road segments is shared among mobile nodes ...
  • Sakata, Tomoyuki; Kasahara, Shoji (Springer, 2015-06-24)
    One of approaches to reducing energy consumption in a data center is to power down a group of servers. In this paper, we consider a power management scheme for distributed parallel processing over clusters of servers, where ...
  • Komatsu, Nobuhisa; Sasabe, Masahiro; Kawahara, Jun; Kasahara, Shoji (Springer, 2015-08-08)
    When large-scale disasters occur, evacuees have to evacuate to safe places quickly. In this paper, we propose an automatic evacuation guiding scheme using mobile nodes of evacuees. Each node tries to navigate its evacuee ...
  • Denzumi, Shuhei; Kawahara, Jun; Tsuda, Koji; Arimura, Hiroki; Minato, Shin-ichi; Sadakane, Kunihiko (Springer, 2014)
    In many real-life problems, we are often faced with manipulating families of sets. Manipulation of large-scale set families is one of the important fundamental techniques for web information retrieval, integration, and ...
  • Takizawa, Atsushi; Takeuchi, Yasufumi; Ohta, Akio; Katoh, Naoki; Inoue, Takeru; Horiyama, Takashi; Kawahara, Jun; Minato, Shin-ichi (IEEE, 2013)
    Japanese cities always have risks of large-scale earthquakes. Thus, it is very important to establish crisis management systems against large-scale disasters such as big earthquakes, and tsunamis to secure evacuation centers ...
  • Andrei, Eugeniyevich Tuchin; Sasabe, Masahiro; Kasahara, Shoji (IEEE, 2016)
    In this paper, we consider a data-flow management mechanism for data center networks, in which a centralized controller called arbiter manages data flows. We propose a simple algorithm for the arbiter to distribute flows ...
  • 笠原, 正治 (公益社団法人日本オペレーションズ・リサーチ学会, 2014-04-01)
    本稿では,情報ネットワークやコンピュータシステムに代表される情報システムに対し,待ち行列理論を用いて性能評価やシステム設計を行うための,対象システムの問題点の捉え方やモデリングについての方法論を紹介する.具体例として,情報通信ネットワークのプロトコル階層の観点から,M/G/1をベースにした待ち行列モデルを紹介し,情報システムの性能評価に対して待ち行列理論による解析を行う意義と留意点について言及する.
  • Yamada, Kohji; Saijo, Yusuke; Nakagami, Hirofumi; Takano, Yoshitaka (American Association for the Advancement of Science, 2016-11-24)
    Microbial pathogens strategically acquire metabolites from their hosts during infection. Here we show that the host can intervene to prevent such metabolite loss to pathogens. Phosphorylation-dependent regulation of sugar ...
  • Inoue, Takeru; Takano, Keiji; Watanabe, Takayuki; Kawahara, Jun; Yoshinaka, Ryo; Kishimoto, Akihiro; Tsuda, Koji; Minato, Shin-ichi; Hayashi, Yasuhiro (IEEE, 2014-01-06)
    Determining loss minimum configuration in a distribution network is a hard discrete optimization problem involving many variables. Since more and more dispersed generators are installed on the demand side of power systems ...
  • Komatsu, Nobuhisa; Sasabe, Masahiro; Kawahara, Jun; Kasahara, Shoji (Springer, 2016-08-30)
    When large-scale disasters occur, evacuees have to evacuate to safe places quickly. They, however, may not be able to afford to obtain sufficient information for their evacuations under such emergent situations. In this ...
  • Yamato, Yuta; Wen, Xiaoqing; Michael A. Kochte; Miyase, Kohei; Kajihara, Seiji; Wang, Laung-Terng (IEEE, 2011)
    High power consumption in scan testing can cause undue yield loss which has increasingly become a serious problem for deep-submicron VLSI circuits. Growing evidence attributes this problem to shift timing failures, which ...
  • Miyase, Kohei; Uchinodan, Yuta; Enokimoto, Kazunari; Yamato, Yuta; Wen, Xiaoqing; Kajihara, Seiji; Wu, Fangmei; Luiji, Dilillo; Alberto, Bosio; Patrick, Girard; Arnaud, Virazel (IEEE, 2011)
    It has become necessary to reduce power during LSI testing. Particularly, during at-speed testing, excessive power consumed during the Launch-To-Capture (LTC) cycle causes serious issues that may lead to the overkill of ...
  • Michael A. Kochte; Miyase, Kohei; Wen, Xiaoqing; Kajihara, Seiji; Yamato, Yuta; Enokimoto, Kazunari; Wunderlich, Hans-Joachim (IEEE, 2011)
    Excessive power dissipation during VLSI testing results in over-testing, yield loss and heat damage of the device. For low power devices with advanced power management features and more stringent power budgets, power-aware ...
  • Wen, Xiaoqing; Enokimoto, Kazunari; Miyase, Kohei; Yamato, Yuta; Michael A. Kochte; Kajihara, Seiji; Girard, Patrick; Tehranipoor, Mohammad (IEEE, 2011)
    At-speed scan testing may suffer from severe yield loss due to the launch safety problem, where test responses are invalidated by excessive launch switching activity (LSA) caused by test stimulus launching in the at-speed ...
  • Sudo, Yuichi; Ooshita, Fukuhito; Kakugawa, Hirotsugu; Masuzawa, Toshimitsu (Leibniz International Proceedings in Informatics, 2015)
    In the population protocol model Angluin et al. proposed in 2004, there exists no self-stabilizing leader election protocol for complete graphs, arbitrary graphs, trees, lines, degree-bounded graphs and so on unless the ...
  • Sudo, Yuichi; Ooshita, Fukuhito; Kakugawa, Hirotsugu; Masuzawa, Toshimitsu (Springer, 2014)
    In the population protocol model Angluin et al. proposed in 2004, there exists no self-stabilizing protocol that solves leader election on complete graphs without knowing the exact number of nodes. To circumvent the ...
  • Yamato, Yuta; Yoneda, Tomokazu; Hatayama, Kazumi; Inoue, Michiko (IEEE, 2012)
    In return for increased operating frequency and reduced supply voltage in nano-scale designs, their vulnerability to IR-drop-induced yield loss grew increasingly apparent. Therefore, it is necessary to consider delay ...
  • Miyase, Kohei; Aso, Masao; Ootsuka, Ryou; Wen, Xiaoqing; Furukawa, Hiroshi; Yamato, Yuta; Enokimoto, Kazunari; Kajihara, Seiji (IEEE, 2012)
    Excessive capture power in at-speed scan testing may cause yield loss due to timing failures. Although reducing the number of clock domains that capture test responses simultaneously is a practical and scalable solution ...
  • Kamei, Sayaka; Lamani, Anissa; Ooshita, Fukuhito (IEEE, 2014)
    We investigate in this paper the gathering problem on ring shaped networks where the aim is to ensure that a collection of identical, oblivious and asynchronous mobile robots meet (gather) in one location not known in ...
  • Ito, Keita; Yoneda, Tomokazu; Yamato, Yuta; Hatayama, Kazumi; Inoue, Michiko (ACM, 2014)
    This paper presents a scan-based BIST architecture for FPGAs used as application-specific embedded devices for low-volume products. The proposed architecture efficiently utilizes memory blocks, instead of logic elements, ...

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