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Browsing by Author "Sakai, Ryota"

Browsing by Author "Sakai, Ryota"

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  • Miyase, Kohei; Sakai, Ryota; Wen, Xiaoqing; Aso, Masao; Furukawa, Hiroshi; Yamato, Yuta; Kajihara, Seiji (一般社団法人電子情報通信学会, 2013-09-01)
    Test power has become a critical issue, especially for low-power devices with deeply optimized functional power profiles. Particularly, excessive capture power in at-speed scan testing may cause timing failures that result ...