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Browsing by Author "Nagai, Shintaro"

Browsing by Author "Nagai, Shintaro"

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  • Ohtake, Satoshi; Nagai, Shintaro; Wada, Hiroki; Fujiwara, Hideo (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2000-11)
    This paper proposes a non-scan design-for-test-ability method for register-transfer level circuits where a cir-cuit consists of a controller and a data path. It achieves com-plete fault efficiency with low hardware overhead ...