DSpace Repository

Browsing by Author "Gizdarski, Emil"

Browsing by Author "Gizdarski, Emil"

Sort by: Order: Results:

  • Gizdarski, Emil; Fujiwara, Hideo (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2001-03)
    In this paper, we present a technique for reducing the test length of the counter-based pseudo-exhaustive built-in self-testing (BIST) using the width compression method and the divide-and-conquer strategy. More formally, ...
  • Gizdarski, Emil; Fujiwara, Hideo (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2000-01)
    In this paper we analyze learning techniques based on the Boolean satisfiability method and find that static indirect ∧-implications and the super gate extraction are useful for increasing the precision of low complexity ...
  • Gizdarski, Emil; Fujiwara, Hideo (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2000-10)
    In this paper we present an efficient and robust test generation algorithm for combinational circuits based on the Boolean satisfiability method called SPIRIT. We elaborate some well-known techniques as well as present ...
  • Gizdarski, Emil; Fujiwara, Hideo (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2000-04)
    In this paper an efficient test pattern generation (TPG) algorithm for combinational circuits is presented. It is based on the Boolean satisfiability (SAT) and single path oriented propagation methods as well as static and ...
  • Inoue, Michiko; Gizdarski, Emil; Fujiwara, Hideo (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 2000-03)
    In our previous work, we introduced a new class of sequential circuits with combinational test generation complexity called internally balanced structure. We reduced the test generation problem for an internally balanced ...