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著者 "Girard, Patrick" のブラウズ:

著者 "Girard, Patrick" のブラウズ:

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  • Wen, Xiaoqing; Enokimoto, Kazunari; Miyase, Kohei; Yamato, Yuta; Michael A. Kochte; Kajihara, Seiji; Girard, Patrick; Tehranipoor, Mohammad (IEEE, 2011)
    At-speed scan testing may suffer from severe yield loss due to the launch safety problem, where test responses are invalidated by excessive launch switching activity (LSA) caused by test stimulus launching in the at-speed ...

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