DSpace/Manakin Repository

著者 "Girard, Patrick" のブラウズ:

著者 "Girard, Patrick" のブラウズ:

ソート項目: ソート順: 表示件数:

  • Wen, Xiaoqing; Enokimoto, Kazunari; Miyase, Kohei; Yamato, Yuta; Michael A. Kochte; Kajihara, Seiji; Girard, Patrick; Tehranipoor, Mohammad (IEEE, 2011)
    At-speed scan testing may suffer from severe yield loss due to the launch safety problem, where test responses are invalidated by excessive launch switching activity (LSA) caused by test stimulus launching in the at-speed ...