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著者 "Das, Debesh Kumar" のブラウズ:

著者 "Das, Debesh Kumar" のブラウズ:

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  • Das, Debesh Kumar; Ohtake, Satoshi; Fujiwara, Hideo (Nara Institute of Science and Technology奈良先端科学技術大学院大学, 1998-11)
    As opposed to scan schemes, non-scan DFT allows at-speed testing. This paper suggests three techniques on non-scan DFT of sequential circuits. The novelty of the proposed techniques is that by using combinational ATPG tool ...