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著者 "Alberto, Bosio" のブラウズ:

著者 "Alberto, Bosio" のブラウズ:

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  • Miyase, Kohei; Uchinodan, Yuta; Enokimoto, Kazunari; Yamato, Yuta; Wen, Xiaoqing; Kajihara, Seiji; Wu, Fangmei; Luiji, Dilillo; Alberto, Bosio; Patrick, Girard; Arnaud, Virazel (IEEE, 2011)
    It has become necessary to reduce power during LSI testing. Particularly, during at-speed testing, excessive power consumed during the Launch-To-Capture (LTC) cycle causes serious issues that may lead to the overkill of ...

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