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Browsing by Author Ooi, Chia Yee

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Issue DateTitleAuthor(s)
Jul-2006Classification of sequential circuits based on acyclic test generation complexityOoi, Chia Yee; Fujiwara, Hideo
Jan-2004Classification of sequential circuits based on combinational test generation complexityOoi, Chia Yee; Fujiwara, Hideo
May-2006A new class of sequential circuits with acyclic test generation complexityOoi, Chia Yee; Fujiwara, Hideo
Jun-2004Some tau-equivalent classes of sequential circuitsOoi, Chia Yee; Fujiwara, Hideo
29-Sep-2006Studies on test generation complexity for stuck-at and path delay faults based on τ[k]-notationOoi, Chia Yee
May-2005Test generation complexity for stuck-at and path delay faults based on tau[k] - notationOoi, Chia Yee; Clouqueur, Thomas; Fujiwara, Hideo
Showing results 1 to 6 of 6

 

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