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naistar (NAIST Academic Repository) >
Browsing by Author Ooi, Chia Yee
Showing results 1 to 6 of 6
| Issue Date | Title | Author(s) | | Jul-2006 | Classification of sequential circuits based on acyclic test generation complexity | Ooi, Chia Yee; Fujiwara, Hideo |
| Jan-2004 | Classification of sequential circuits based on combinational test generation complexity | Ooi, Chia Yee; Fujiwara, Hideo |
| May-2006 | A new class of sequential circuits with acyclic test generation complexity | Ooi, Chia Yee; Fujiwara, Hideo |
| Jun-2004 | Some tau-equivalent classes of sequential circuits | Ooi, Chia Yee; Fujiwara, Hideo |
| 29-Sep-2006 | Studies on test generation complexity for stuck-at and path delay faults based on τ[k]-notation | Ooi, Chia Yee |
| May-2005 | Test generation complexity for stuck-at and path delay faults based on tau[k] - notation | Ooi, Chia Yee; Clouqueur, Thomas; Fujiwara, Hideo |
Showing results 1 to 6 of 6
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