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Browsing by Author Iwagaki, Tsuyoshi
Showing results 1 to 4 of 4
| Issue Date | Title | Author(s) | | Dec-2004 | Acceleration of transition test generation for acyclic sewuential circuits utilizing constrained combinational stuck-at test generation | Iwagaki, Tsuyoshi; Ohtake, Satoshi; Fujiwara, Hideo |
| Sep-2003 | A design scheme for delay fault testability of controllers using state transition information | Iwagaki, Tsuyoshi; Ohtake, Satoshi; Fujiwara, Hideo |
| Sep-2003 | Reducibility of sequential test generation to combinational test generation for several delay fault models | Iwagaki, Tsuyoshi; Ohtake, Satoshi; Fujiwara, Hideo |
| 30-Sep-2004 | Studies on Design for Delay Testability and Delay Test Generation for Sequential Circuits | Iwagaki, Tsuyoshi |
Showing results 1 to 4 of 4
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