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Browsing by Author Inoue, Tomoo

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Issue DateTitleAuthor(s)
Jul-1997Sequential test generation based on circuit pseudo-transformationOhtake, Satoshi; Inoue, Tomoo; Fujiwara, Hideo
Apr-1999Test Generation for Acyclic Sequential Circuits with Hold RegistersInoue, Tomoo; Sano, Chiiho; Mihara, Takahiro; Fujiwara, Hideo
Apr-1999Universal Test Complexity of Field-Programmable Gate ArraysInoue, Tomoo; Fujiwara, Hideo; Michinishi, Hiroyuki; Yokohira, Tokumi; Okamoto, Takuji
Showing results 1 to 3 of 3


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